Workshops.

Imaris: The Ideal Solution to interactively Analyze Microscopy images .

Imaris from Oxford Instrument is the world’s leading interactive microscopy image analysis software company and was founded in 1992 in Switzerland. Through their constant innovation and a clear focus on 3D and 4D image visualization analysis, we actively shape the way scientists process multi-dimensional microscopic images.

Imaris includes a set of key tools, which cater for the needs of researchers in live cell imaging. The available tools in Imaris include among others:

  • visualization and Surface segmentation of terabyte multi-dimensional data sets
  • ability to simultaneously visualize multiple 2D, 3D or 4D images
  • detection, tracking and analysis of cells and organelles
  • tracking of cell division, lineage analysis
  • rotational and translational drift correction
  • Neuron and spine analysis
  • Colocalization studies
  • advanced interactive plotting for results exploration and comparison between samples
  • a wide range of plugins (XTensions in Matlab, Python…)
  • alignment and stitching of multiple tiles to export images Terabytes in size

The workshop given by Dr. Golfis Gerogia will bring an overview of Imaris software capabilities with emphasis on Imaris 9.5 novelties. The workshop will give users the knowledge on how to start with Imaris and quickly get microscopic image analyzed to extract statistics so that they can rationalize their experiments.

Dr. Georgia Golfis g.golfis@bitplane.com

To Register for this workshop contact Gavin Mc Manus mcmanug@tcd.ie

Phenom proX system .

The Phenom SEM microscopes are intuitive to use, fast to create results and built to high quality standards. These core principles have been used to develop and create the Phenom ProX spectroscopy system for best-in-class imaging and analysis. Compared to its predecessors, the Generation 5 Phenom ProX SEM has at least a 20% better resolution, and an even better user experience to address a wider range of applications, including samples that are very sensitive to beam damage. Alongside acquiring high-resolution images of microscopic structures, there is often a need to identify the different chemical elements in a specimen.

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This is accomplished in the Phenom ProX with the Element Identification (EID) software package and a specially designed and fully integrated Energy Dispersive Spectrometer (EDS). The Phenom ProX is the most extended solution for fast and user friendly imaging and analysis. This is enhanced by additional sample holders that allow for example sample tilting and cooling for imaging an even greater diversity of samples.

FIB-SEM Tomography.

Title:  Enabling Advanced FIB-SEM Tomography with ZEISS Atlas 5

  • In this workshop we will first review the basic principles of FIB-SEM tomography.
  • We will then discuss the challenges of highest-resolution analytical FIB-SEM tomography and how these can be solved.
  • For example, True-Z technology allows to control the tomogram slice thickness live during the experiment to reach isotropic voxel sizes down to 5nm and below.
  • You will learn how any remaining variability in slice thickness can be accounted for before reconstructing the data in 3D.
  • During the session we will observe a ZEISS FIB-SEM at work.

Workshops are limited to 6 places per slot and a total of 3 slots available on the 8th January.  Please specify you preference with either AM or PM by emailing the below contacts.  We will endeavour to allocate as requested.

Ben Ridder ben.ridder@zeiss.com

Matthew Haley matthew.haley@zeiss.com

LSM 980 with Airyscan 2.

The most flexible confocal research platform, discover the ZEISS LSM 980 with Airyscan 2 at Microscopy Society of Ireland Symposium on the 8th January 2020

90 minute workshops available with practical demonstration of the
system available by advance booking. For more information or to book a demo slot please contact:

Ben Ridder ben.ridder@zeiss.com

Matthew Haley matthew.haley@zeiss.com

To Register for this workshop contact Gavin Mc Manus mcmanug@tcd.ie

Composition analysis of electron transparent samples by EDXS in TEM and T-SEM.

Speaker: Meiken Falke

In this workshop we will explain how to achieve the best EDS quantification results for electron transparent samples with the QUANTAX EDS for TEM system. EDS quantification for electron transparent samples will be explained. Available methods and their application will be shown following a simple guideline. Possible pitfalls and successful approaches will be discussed.

Participants can bring their laptop, but that is not a condition to be able to take part or to follow the workshop.

Main topics are:

  • Suitable specimen mounting
  • System setup and good approaches for EDS data acquisition
  • Quantification steps
  • Background- and peak-fit models,
  • Calibration options, also off-line
  • The Cliff-Lorimer and the Zeta-factor method; which to use when
  • Theoretical and experimental Cliff-Lorimer and Zeta-factors
  • Display of quantitative results in pseudo-color and in tables for
    • Spectra
    • Line Scans
    • Hypermaps / regions of interest
  • High spatial resolution EDS

To Register for this workshop contact Lewys Jones lewys.jones@tcd.ie

Industrial Microscopes – DSX1000 Digital Microscopes.

In the past demands from the life Science market were primarily focused on imaging tissue or Cells. As Bioengineering and medical device innovation expands the industrial product range is often seen in the Life Science research laboratory. Come and see the DSX1000 provide fast 3D images of solid materials. Produce high quality 3D images and measure your samples accurately with a large toolbox of measurement options.

Please bring your samples along and we can image them for you.

To Register for this workshop contact Gavin Mc Manus mcmanug@tcd.ie

Towards Automated Multiscale Correlative Workflows (micro CT – TEM).

Correlative Multiscale Multimodal Tomography (CM2T) is a workflow of spatial registration in two and three dimensions of many imaging modalities – light microscopy, scanning electron/ion microscopy, 2D/3D transmission electron microscopy, X-Ray computed tomography, 2D/3D EBSD, EDS, Raman, etc. – that allows various types of information, and at different lenghscale, to be collected for the same region of interest.

In this workshop we preset one of our workflows that combines sample, region of interest and data transfer from micro CT to Plasma FIB DualBeam and later to TEM microscope. We put attentions on sample preparation, sample transfer and data coordinates locking at different length scales. As a practical example we use our CM2T workflow to investigate cracking in Blown Powder Laser Deposited (BPLD) superalloy IN718 builds.

CM2T is supported with latest HeliScanTM metrological micro X-Ray CT system, HeliosTMHydraTM DualBeamTM, Laser PFIB TriBeam and TalosTM STEM microscopes and unique, software integrated instrumental environment using inter-linked software: Auto Slice & View 4TM, AvizoTM, MapsTM and AutoTEMTM.

Edwards & MT Trinity College workshop.